大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 Institute of Southeast Asian Studies 的图书(共3322本)

Studies in complexity theory

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索取号：TP301/E904
作者：
出版社：London : Pitman ; New York : Wiley, 1986.

Advanced computer concepts (La Jolla Institute, 1981)

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索取号：TP3-53/E9030/1981
作者：
出版社：La Jolla : LJI, 1981.

1984 conference proceedings : Third Annual International Phoenix Conference on Computers and Communications

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索取号：TN91-53/E9014/3
作者：International Phoenix Conference on Computers and Communications (3rd : 1984)、Institute of Electrical and Electronics Engineers.、IEEE Computer Society.、IEEE Communications Society.、
出版社：N.Y. Silver Spring, MD. : IEEE Computer Society Press ; Los Angeles, CA. : Order from IEEE Computer Society, 1984.

1983 conference proceedings

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索取号：TN91-53/E9014/2
作者：Phoenix Conference on Computers and Communications (2nd : 1983)、Institute of Electrical and Electronics Engineers.、IEEE Computer Society.、IEEE Communications Society.、
出版社：N.Y. Silver Spring, MD (1109 Spring St., Silver Spring 20910) : IEEE Computer Society Press, 1983.

Proceedings of the Symposium on Computers and Automata : New York, N.Y., April 13-15, 1971

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索取号：TP3-53/E806/1971
作者：Symposium on Computers and Automata (1971 : New York)、Fox、 Jerome.、Polytechnic Institute of Brooklyn. Microwave Research Institute.、
出版社：Brooklyn, N.Y. : Polytechnic Press of the Polytechnic Institute of Brooklyn, c1971.

Computer science and scientific computing : proceedings of the Third ICASE Conference on Scientific Computing, Williamsburg, Virginia April 1 and 2, 1976

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索取号：TP3-53/E8019/3
作者：Icase Conference on Scientific Computing、 3d、 Williamsburg、 Va.、 1976.、Ortega、 James M.、 1932-、Institute for Computer Applications in Science and Engineering.、
出版社：New York : Academic Press, 1976.

The end of the "Asian model"?

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索取号：F131.00/E20011
作者：
出版社：New York : Walter de Gruyter, 1999.

The quest for sustained growth : Southeast Asian and Southeast European cases

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索取号：F133.04/E20011
作者：
出版社：Washington, D.C. : Woodrow Wilson Center Press ; Baltimore : Distributed by JohnHopkins University Press, c1999.

Defence and decolonisation in Southeast Asia : Britain, Malaya and Singapore, 1941-1968

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索取号：D733.00/E20011
作者：Hack、 Karl.、
出版社：Richmond, UK : Curzon, 2001.

The global dynamics of news : studies in international news coverage and news agenda

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索取号：G21/E20011
作者：
出版社：Stamford, Conn. : Ablex Pub. Corp., c2000.

TV living : television, culture, and everyday life

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索取号：C912.3/E992
作者：Gauntlett、 David.、Hill、 Annette.、British Film Institute.、
出版社：London ; New York : Routledge, 1999.

Proceedings

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索取号：TP29-53/E904/1
作者：IEEE International Conference on Office Automation (1st : 1984 : New Orleans、 La.)、Taylor、 R. W. (Robert William)、 1932-、Institute of Electrical and Electronics Engineers.、
出版社：Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1984.

Flexible manufacturing systems : methods and studies

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索取号：TP273/E9014
作者：
出版社：Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.

1985 IEEE International Conference on Robotics and Automation, March 25-28, 1985, Marriott's Pavilion Hotel, St. Louis, Missouri

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索取号：TP252-53/E901/1985
作者：IEEE International Conference on Robotics and Automation (1985 : St. Louis、 Mo.)、IEEE Computer Society.、Institute of Electrical and Electronics Engineers.、
出版社：Silver Spring, MD : IEEE Computer Society Press ; Los Angeles CA : Order from IEEE Computer Society, 1984.

Autotestcon '85, November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas new horizons in automatic testing

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索取号：TP216-53/E901/1985
作者：IEEE International Automatic Testing Conference (1985 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、
出版社：New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, 1985.47,c1983.

Autotestcon '82, October 12-14 : 1982 IEEE International Automatic Testing Conference, Dayton Convention Center, Dayton, Ohio

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索取号：TP216-53/E901/1982
作者：IEEE International Automatic Testing Conference (1982 : Dayton、 Ohio)、Institute of Electrical and Electronic Engineers.、
出版社：New York, N.Y. (345 E. 47th St., New York 10017) : IEEE, c1982.